Invention Grant
- Patent Title: Ultrasonic probe for examining an object with ultrasound and corresponding examination method
- Patent Title (中): 用超声波检查物体的超声波探头和相应的检查方法
-
Application No.: US14509455Application Date: 2014-10-08
-
Publication No.: US09541529B2Publication Date: 2017-01-10
- Inventor: Matthieu Taglione , Yannick Caulier
- Applicant: AREVA NP
- Applicant Address: FR Courbevoie
- Assignee: AREVA NP
- Current Assignee: AREVA NP
- Current Assignee Address: FR Courbevoie
- Agency: Davidson, Davidson & Kappel, LLC
- Priority: FR1359807 20131009
- Main IPC: G01B17/02
- IPC: G01B17/02 ; G01N29/24 ; G01B21/20 ; G01N29/26 ; G01N21/88 ; G01B17/06 ; G01B11/24

Abstract:
An ultrasonic probe for examining an object with ultrasound and a corresponding examination method are provided. The probe includes a plurality of emitter elements able to emit ultrasonic waves for emitting a focused ultrasonic beam into the object through an active area of a surface of the object, and a profilometer for determining the profile of the surface of the object and for controlling the emission of the ultrasonic beam depending on the determined profile. The profilometer includes an image-taking apparatus for taking at least one digital image of the active area and an image processing module able to determine the profile of the active area by analyzing the optical blurring of the or at least one image.
Public/Granted literature
- US20150096381A1 ULTRASONIC PROBE FOR EXAMINING AN OBJECT WITH ULTRASOUND AND CORRESPONDING EXAMINATION METHOD Public/Granted day:2015-04-09
Information query