Invention Grant
US09543124B2 Capacitively coupled plasma source for abating compounds produced in semiconductor processes
有权
用于减少在半导体工艺中产生的化合物的电容耦合等离子体源
- Patent Title: Capacitively coupled plasma source for abating compounds produced in semiconductor processes
- Patent Title (中): 用于减少在半导体工艺中产生的化合物的电容耦合等离子体源
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Application No.: US14986070Application Date: 2015-12-31
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Publication No.: US09543124B2Publication Date: 2017-01-10
- Inventor: Michael S. Cox , Rongping Wang , Brian T. West , Roger M. Johnson , Colin John Dickinson
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: H01J7/24
- IPC: H01J7/24 ; H01J37/32 ; H01J37/16

Abstract:
Embodiments disclosed herein include a plasma source for abating compounds produced in semiconductor processes. The plasma source has a first plate and a second plate parallel to the first plate. An electrode is disposed between the first and second plates and an outer wall is disposed between the first and second plates surrounding the cylindrical electrode. The plasma source has a first plurality of magnets disposed on the first plate and a second plurality of magnets disposed on the second plate. The magnetic field created by the first and second plurality of magnets is substantially perpendicular to the electric field created between the electrode and the outer wall. In this configuration, a dense plasma is created.
Public/Granted literature
- US20160118226A1 HALL EFFECT ENHANCED CAPACITIVELY COUPLED PLASMA SOURCE Public/Granted day:2016-04-28
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