Invention Grant
US09543245B2 Semiconductor sensor device and method of producing a semiconductor sensor device 有权
半导体传感器装置及半导体传感器装置的制造方法

  • Patent Title: Semiconductor sensor device and method of producing a semiconductor sensor device
  • Patent Title (中): 半导体传感器装置及半导体传感器装置的制造方法
  • Application No.: US14441165
    Application Date: 2013-09-23
  • Publication No.: US09543245B2
    Publication Date: 2017-01-10
  • Inventor: Franz SchrankMartin Schrems
  • Applicant: ams AG
  • Applicant Address: AT Unterpremstaetten
  • Assignee: ams AG
  • Current Assignee: ams AG
  • Current Assignee Address: AT Unterpremstaetten
  • Agency: McDermott Will & Emery LLP
  • Priority: EP12191647 20121107
  • International Application: PCT/EP2013/069705 WO 20130923
  • International Announcement: WO2014/072114 WO 20140515
  • Main IPC: G01N27/12
  • IPC: G01N27/12 H01L23/528 H01L21/50 H01L23/00 H01L21/56 H01L23/31
Semiconductor sensor device and method of producing a semiconductor sensor device
Abstract:
The semiconductor device comprises a substrate (1) of semiconductor material with a front side (4) and an opposite rear side (7), a wiring layer (5) at the front side (4), a further wiring layer (8) at the rear side (7), and a through-substrate via (3) connecting the wiring layer (5) and the further wiring layer (8). A hot plate (24) is arranged on or in the substrate, and a sensor layer (21) is arranged in the vicinity of the hot plate. A mold compound (14) is arranged on the rear side (7) above the substrate (1), a cavity (17) is formed in the mold compound (14) to accommodate the sensor layer (21), and the cavity (17) is covered with a membrane (15).
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