Invention Grant
- Patent Title: Semiconductor isolation structure
- Patent Title (中): 半导体隔离结构
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Application No.: US14672601Application Date: 2015-03-30
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Publication No.: US09543288B2Publication Date: 2017-01-10
- Inventor: Joan Wichard Strijker , Inesz Marycka Emmerik-Weijland
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP14164475 20140411
- Main IPC: H01L23/62
- IPC: H01L23/62 ; H01L27/02 ; H01L29/866 ; H05K1/02 ; H02H9/04 ; H01L29/87 ; H01L21/8238

Abstract:
The invention relates to a semiconductor isolation structure. More particularly, the present invention relates to a semiconductor isolation structure suitable for providing high voltage isolation. Embodiments disclosed include a semiconductor structure (10) comprising: a first semiconductor region (R1), a second semiconductor region (R2) within the first semiconductor region (R1), and a voltage isolator (11) separating the first and second semiconductor regions (R1, R2), the voltage isolator (11) comprising: a nested series of insulating regions (T1, T2) around the perimeter of the second semiconductor region (R2), an intermediate semiconductor region (I1, I2) between each adjacent pair of nested insulating regions (T1, T2), and a voltage control device (12) comprising a conducting element (D1-D3) connected to at least one intermediate semiconductor region (I1, I2) in parallel with the at least one insulating region (T1, T2), so as to control a voltage across the at least one insulating region (T1, T2).
Public/Granted literature
- US20150294965A1 SEMICONDUCTOR ISOLATION STRUCTURE Public/Granted day:2015-10-15
Information query
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