Invention Grant
- Patent Title: Method of inspecting a light source module for defects, method of manufacturing a light source module, and apparatus for inspecting a light source module
- Patent Title (中): 检查缺陷的光源模块的方法，制造光源模块的方法，以及用于检查光源模块的装置
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Application No.: US14581147Application Date: 2014-12-23
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Publication No.: US09546926B2Publication Date: 2017-01-17
- Inventor: Won Soo Ji , Oh Seok Kwon , Dae Seo Park , Ka Ram Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse P.C.
- Priority: KR10-2014-0069234 20140609
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01M11/02 ; G01J1/42
Abstract:
A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.
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