Invention Grant
US09546949B2 Parallel optical thin film measurement system for analyzing multianalytes
有权
平行光学薄膜测量系统用于分析多分辨率
- Patent Title: Parallel optical thin film measurement system for analyzing multianalytes
- Patent Title (中): 平行光学薄膜测量系统用于分析多分辨率
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Application No.: US14408725Application Date: 2013-12-20
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Publication No.: US09546949B2Publication Date: 2017-01-17
- Inventor: Neal G. Skinner
- Applicant: Halliburton Energy Services, Inc.
- Applicant Address: US TX Houston
- Assignee: Halliburton Energy Services, Inc.
- Current Assignee: Halliburton Energy Services, Inc.
- Current Assignee Address: US TX Houston
- Agency: McDermott Will & Emery LLP
- Agent Benjamin Fite
- International Application: PCT/US2013/077017 WO 20131220
- International Announcement: WO2015/094351 WO 20150625
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/31 ; G01N21/27 ; G01J3/00 ; G01N21/25 ; G01J3/28 ; G01J3/32 ; G01N21/552 ; G01J3/12

Abstract:
Optical computing devices including a light source that emits electromagnetic radiation into an optical train extending from the light source to a detector, a substance arranged in the optical train and configured to optically interact with the electromagnetic radiation and produce sample interacted radiation, a processor array arranged in the optical train and including a plurality of ICE arranged on a substrate and configured to optically interact with the electromagnetic radiation. The detector receives modified electromagnetic radiation generated through optical interaction of the electromagnetic radiation with the substance and the processor array. A weighting device is coupled to one or more of the ICE to optically apply a weighting factor to the modified electromagnetic radiation prior to being received by the detector, wherein the detector generates an output signal indicative of a characteristic of the substance based on beams of modified electromagnetic radiation.
Public/Granted literature
- US20150346087A1 PARALLEL OPTICAL THIN FILM MEASUREMENT SYSTEM FOR ANALYZING MULTIANALYTES Public/Granted day:2015-12-03
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