Invention Grant
- Patent Title: Peak offset correction for analyte test strip
- Patent Title (中): 分析物测试条的峰值偏移校正
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Application No.: US14119410Application Date: 2012-05-25
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Publication No.: US09546973B2Publication Date: 2017-01-17
- Inventor: Joanne McIlrath
- Applicant: Joanne McIlrath
- Applicant Address: GB Inverness
- Assignee: LifeScan Scotland Limited
- Current Assignee: LifeScan Scotland Limited
- Current Assignee Address: GB Inverness
- International Application: PCT/GB2012/051192 WO 20120525
- International Announcement: WO2012/164271 WO 20121206
- Main IPC: G01N27/327
- IPC: G01N27/327
Abstract:
Measurement with a test strip having two working electrodes (12, 14), using the current transient (402, 404) for each working electrode measured at a predetermined durational offset (Tpred1, Tpred2) from a peak (408, 410) of the current transient.
Public/Granted literature
- US20140202882A1 PEAK OFFSET CORRECTION FOR ANALYTE TEST STRIP Public/Granted day:2014-07-24
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