Invention Grant
- Patent Title: Device for current measurement
- Patent Title (中): 电流测量装置
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Application No.: US14264635Application Date: 2014-04-29
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Publication No.: US09547024B2Publication Date: 2017-01-17
- Inventor: Robert Racz , Mathieu Ackermann , Jian Chen
- Applicant: Melexis Technologies NV
- Applicant Address: BE Tessenderlo
- Assignee: Melexis Technologies NV
- Current Assignee: Melexis Technologies NV
- Current Assignee Address: BE Tessenderlo
- Agency: McCormick, Paulding & Huber LLP
- Priority: CH0924/13 20130507; CH1130/13 20130617
- Main IPC: G01R33/07
- IPC: G01R33/07 ; G01R19/00 ; G01R15/20

Abstract:
A device for current measurement comprises a substrate with a first current conductor and a current sensor with a second current conductor. The current sensor is mounted above the first current conductor on the substrate. The second current conductor is formed with integrally attached first and second terminal leads through which the current to be measured is supplied and discharged. The current sensor further comprises a semiconductor chip with a magnetic field sensor mounted on the second current conductor on the side of the second current conductor facing the substrate. The magnetic field sensor is sensitive to a component of the magnetic field extending parallel to the surface of the semiconductor chip and perpendicular to the second current conductor. The second current conductor extends above and parallel to the first current conductor.
Public/Granted literature
- US20140333301A1 DEVICE FOR CURRENT MEASUREMENT Public/Granted day:2014-11-13
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