Invention Grant
- Patent Title: Method for a rapid determination of spatially resolved magnetic resonance relaxation parameters in an area of examination
- Patent Title (中): 在检查区域快速测定空间分辨磁共振松弛参数的方法
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Application No.: US13866328Application Date: 2013-04-19
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Publication No.: US09547059B2Publication Date: 2017-01-17
- Inventor: Andreas Greiser , Peter Schmitt , Hui Xue
- Applicant: Andreas Greiser , Peter Schmitt , Hui Xue
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- Priority: DE102012206585 20120420
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01R33/50 ; G01R33/56 ; G01R33/565

Abstract:
In a method for a rapid determination of spatially resolved magnetic resonance relaxation parameters in an area of examination, a preparation pulse is radiated into the area of examination. During the relaxation of the longitudinal magnetization, spatially encoded magnetic resonance signals are acquired at a minimum of two different points in time using a fast magnetic resonance sequence. At each inversion time, an image data record is reconstructed from the magnetic resonance signals, which are elastically registered to each other. From the recorded image data records, values of magnetic resonance relaxation parameters are spatially accurately determined.
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