Invention Grant
- Patent Title: Automatic profiling report generation
- Patent Title (中): 自动分析报表生成
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Application No.: US14528151Application Date: 2014-10-30
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Publication No.: US09547537B2Publication Date: 2017-01-17
- Inventor: Johannes Scheerer , Ralf Schmelter , Steffen Schreiber , Dietrich Mostowoj , Thomas Klink , Matthias Braun
- Applicant: Johannes Scheerer , Ralf Schmelter , Steffen Schreiber , Dietrich Mostowoj , Thomas Klink , Matthias Braun
- Applicant Address: DE Walldorf
- Assignee: SAP SE
- Current Assignee: SAP SE
- Current Assignee Address: DE Walldorf
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F9/44 ; G06F9/46 ; G06F13/00 ; G06F9/54 ; G06F9/455 ; G06F11/34

Abstract:
A method for profiling an application on a virtual machine is provided. A series of analysis steps to be performed on profiled data can be created. The series of analysis steps can be saved as a report specification. A back-end profiler can then be caused to perform profiling on the application. Profiled data can be received from the back-end profiler. The profiled data can be stored as a model. The model can then be adapted based on the series of analysis steps from the report specification. Output data can be generated based on the adapted model. Finally, the output data is displayed to a user.
Public/Granted literature
- US20160124780A1 Automatic Profiling Report Generation Public/Granted day:2016-05-05
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