Invention Grant
US09547544B2 Method for verifying bad pattern in time series sensing data and apparatus thereof
有权
用于验证时间序列感测数据中的不良图案的方法及其装置
- Patent Title: Method for verifying bad pattern in time series sensing data and apparatus thereof
- Patent Title (中): 用于验证时间序列感测数据中的不良图案的方法及其装置
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Application No.: US14306967Application Date: 2014-06-17
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Publication No.: US09547544B2Publication Date: 2017-01-17
- Inventor: Kae Young Shin , Dae Jung Ahn , Dae Hong Seo , Woo Young Jung
- Applicant: SAMSUNG SDS CO., LTD.
- Applicant Address: KR Seoul
- Assignee: SAMSUNG SDS CO., LTD.
- Current Assignee: SAMSUNG SDS CO., LTD.
- Current Assignee Address: KR Seoul
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2013-0069678 20130618
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; H03M13/01 ; G01R31/317

Abstract:
A method for verifying bad pattern in time series sensing data by calculating a bad pattern error rate, which can be applied to the time series sensing data measured and produced from a predetermined sensor provided in predetermined equipment, and an apparatus thereof are provided. The method includes receiving information on the bad pattern applied to time series sensing data measured by a suspicious sensor, accessing the time series sensing data of each product, generated by the suspicious sensor during a verification period, calculating similarity measures between the bad pattern based on the bad pattern information and the time series sensing data for each product, and calculating an error rate of the bad pattern based on the similarity measures.
Public/Granted literature
- US20140372813A1 METHOD FOR VERIFYING BAD PATTERN IN TIME SERIES SENSING DATA AND APPARATUS THEREOF Public/Granted day:2014-12-18
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