Invention Grant
- Patent Title: Method and apparatus for verifying circuit design
- Patent Title (中): 用于验证电路设计的方法和装置
-
Application No.: US14134435Application Date: 2013-12-19
-
Publication No.: US09547568B2Publication Date: 2017-01-17
- Inventor: Taku Kawamura
- Applicant: SOCIONEXT INC.
- Applicant Address: JP Kanagawa
- Assignee: SOCIONEXT INC.
- Current Assignee: SOCIONEXT INC.
- Current Assignee Address: JP Kanagawa
- Agency: Staas & Halsey LLP
- Priority: JP2013-016352 20130131
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G06F13/42

Abstract:
A verification test is performed on a device containing master and slave units connected via a bus. In the verification test, a first signal is transferred between a first master unit and a first slave unit during a first transfer period while a second signal is transferred between a second master unit and a second slave unit during a second transfer period. The second transfer period overlaps at least a part of the first transfer period. When the first transfer period is longer than a third transfer period, first combination information indicating the combination of the first master unit and first slave unit is stored in a storage unit, in conjunction with second combination information indicating the combination of the second master unit and second slave unit.
Public/Granted literature
- US20140214355A1 METHOD AND APPARATUS FOR VERIFYING CIRCUIT DESIGN Public/Granted day:2014-07-31
Information query