Invention Grant
- Patent Title: Method and apparatus for accelerated data quality checking
- Patent Title (中): 用于加速数据质量检查的方法和装置
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Application No.: US13759430Application Date: 2013-02-05
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Publication No.: US09547824B2Publication Date: 2017-01-17
- Inventor: Ronald S. Indeck , David Mark Indeck , Naveen Singla , Jason R. White
- Applicant: IP Reservoir, LLC
- Applicant Address: US MO St. Louis
- Assignee: IP Reservoir, LLC
- Current Assignee: IP Reservoir, LLC
- Current Assignee Address: US MO St. Louis
- Agency: Thompson Coburn LLP
- Main IPC: G06N5/00
- IPC: G06N5/00 ; G06F1/00 ; G06N5/02

Abstract:
Disclosed herein is a method and apparatus for hardware-accelerating various data quality checking operations. Incoming data streams can be processed with respect to a plurality of data quality check operations using offload engines (e.g., reconfigurable logic such as field programmable gate arrays (FPGAs)). Accelerated data quality checking can be highly advantageous for use in connection with Extract, Transfer, and Load (ETL) systems.
Public/Granted literature
- US20130151458A1 Method and Apparatus for Accelerated Data Quality Checking Public/Granted day:2013-06-13
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06N | 基于特定计算模型的计算机系统 |
G06N5/00 | 利用基于知识的模式的计算机系统 |