Invention Grant
US09548116B2 Resistive memory with program verify and erase verify capability
有权
具有程序验证和擦除验证功能的电阻式存储器
- Patent Title: Resistive memory with program verify and erase verify capability
- Patent Title (中): 具有程序验证和擦除验证功能的电阻式存储器
-
Application No.: US14554826Application Date: 2014-11-26
-
Publication No.: US09548116B2Publication Date: 2017-01-17
- Inventor: Anirban Roy , Michael A. Sadd
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C13/00

Abstract:
A resistive non-volatile memory cell is programmed. A programming voltage is applied to a first terminal of the resistive non-volatile memory cell. Sensing, during the applying the programming voltage, determines if the resistive non-volatile memory cell has been programmed. Current is limited through the resistive non-volatile memory cell to a first magnitude. After a predetermined time, if the sensing has not detected that the resistive non-volatile memory cell has been programmed, the current through the resistive non-volatile memory cell is limited to a second magnitude greater than the first magnitude. The resistive non-volatile memory cell is also erased.
Public/Granted literature
- US20160148685A1 RESISTIVE MEMORY WITH PROGRAM VERIFY AND ERASE VERIFY CAPABILITY Public/Granted day:2016-05-26
Information query