Invention Grant
US09548383B2 HEMT with a metal film between the gate electrode and the drain electrode
有权
HEMT在栅电极和漏电极之间具有金属膜
- Patent Title: HEMT with a metal film between the gate electrode and the drain electrode
- Patent Title (中): HEMT在栅电极和漏电极之间具有金属膜
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Application No.: US14337911Application Date: 2014-07-22
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Publication No.: US09548383B2Publication Date: 2017-01-17
- Inventor: Kozo Makiyama
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JP2013-176002 20130827
- Main IPC: H01L29/778
- IPC: H01L29/778 ; H01L29/10 ; H01L29/66 ; H01L29/40 ; H01L23/31 ; H01L29/417 ; H01L29/423

Abstract:
A compound semiconductor device includes a channel layer of first arsenide semiconductor, an electron supply layer of second arsenide semiconductor over the channel layer, a gate electrode, a source electrode and a drain electrode over the channel layer, and a metal film between the gate electrode and the drain electrode, the metal film being insulated from the gate electrode and the drain electrode.
Public/Granted literature
- US20150060946A1 COMPOUND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2015-03-05
Information query
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