Invention Grant
- Patent Title: Method and apparatus for performing power supply self-diagnostics in redundant power architectures
- Patent Title (中): 用于在冗余电源架构中执行电源自诊断的方法和装置
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Application No.: US13680733Application Date: 2012-11-19
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Publication No.: US09548627B1Publication Date: 2017-01-17
- Inventor: Joseph P. King, Jr. , Phillip J. Roux , Michael A. Faulkner , Robert M. Beauchamp , Robert A. Guenther
- Applicant: Joseph P. King, Jr. , Phillip J. Roux , Michael A. Faulkner , Robert M. Beauchamp , Robert A. Guenther
- Applicant Address: US MA Hopkinton
- Assignee: EMC IP Holding Company LLC
- Current Assignee: EMC IP Holding Company LLC
- Current Assignee Address: US MA Hopkinton
- Agent Krishnendu Gupta; Konrad R. Lee
- Main IPC: H02J1/10
- IPC: H02J1/10 ; G06F11/24 ; G01R31/40 ; H02J9/00

Abstract:
A system for detecting latent defects within a redundant power architecture includes a plurality of redundant power supplies, each having one or more output power rails, connected in a redundant fashion to a system load; each power supply output having fault-isolating OR'ing circuitry that prevents reverse current flow when free of defects; each power supply having means for adjusting its output voltage; each power supply having means for monitoring an internal voltage therein, and, based on characteristics of the monitored internal voltage, determining the presence of latent defect/s in the fault-isolating “OR'ing” circuitry. Further, the system operates to shift the load demanded from power supplies in redundant power architectures to allow the power supplies to run at their optimum electrical efficiency.
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