Invention Grant
- Patent Title: Reducing MEMS stiction by increasing surface roughness
- Patent Title (中): 通过增加表面粗糙度来减少MEMS粘结
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Application No.: US14574784Application Date: 2014-12-18
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Publication No.: US09550664B2Publication Date: 2017-01-24
- Inventor: Ruben B. Montez , Robert F. Steimle
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: NXP USA, INC.
- Current Assignee: NXP USA, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H01L29/84
- IPC: H01L29/84 ; B81B3/00

Abstract:
A mechanism for reducing stiction in a MEMS device by decreasing surface area between two surfaces, such as a travel stop and travel stop region, that can come into close contact is provided. Reduction in contact surface area is achieved by increasing surface roughness of the travel stop region. This is achieved by depositing a polysilicon layer over a dielectric layer using gaseous hydrochloric acid as one of the reactants. A subsequent etch back is performed to further increase the roughness. The deposition of polysilicon and subsequent etch back may be repeated one or more times in order to obtain the desired roughness. A final polysilicon layer may then be deposited to achieve a desired thickness. This final polysilicon layer is patterned to form the travel stop regions. The rougher surface decreases the surface area available for contact and, in turn, decreases the area through which stiction can be imparted.
Public/Granted literature
- US20160176707A1 REDUCING MEMS STICTION BY INCREASING SURFACE ROUGHNESS Public/Granted day:2016-06-23
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