Test apparatus and method of testing kinetic switches. The test apparatus utilizes an RFID device attached to a high speed centrifuge on which the kinetic switches are mounted for testing. Sensors monitor the operation of the kinetic switch for movement from a first position to a second position. In addition, the speed of the centrifuge at the time of the movement is determined. This information may be transmitted in real time as received by the RFID device or saved in RFID memory and transmitted to determine the force applied to the kinetic switch at the time of the movement so that the acceptability of the kinetic switch can be determined.