Invention Grant
- Patent Title: Magnetic field measuring device
- Patent Title (中): 磁场测量装置
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Application No.: US15177818Application Date: 2016-06-09
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Publication No.: US09551764B2Publication Date: 2017-01-24
- Inventor: Joerg Franke
- Applicant: Micronas GmbH
- Applicant Address: DE Freiburg
- Assignee: Micronas GmbH
- Current Assignee: Micronas GmbH
- Current Assignee Address: DE Freiburg
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: DE102015007190 20150609
- Main IPC: H01L43/04
- IPC: H01L43/04 ; G01R33/07 ; H01L43/06

Abstract:
A magnetic field measuring device having a first semiconductor body having a surface formed in a first x-y plane, the first semiconductor body having on the surface two magnetic field sensors which are spaced apart and arranged along a first connecting line, and wherein the magnetic field sensors respectively measure a z-component of a magnetic field, and the x-direction and the y-direction and the z-direction are each formed orthogonally to each other. A first magnet is provided with a planar main extension surface formed in a second x-y plane and with a symmetry surface formed in an x-z plane, wherein the direction of magnetization extends substantially or exactly parallel to the main extension surface and substantially or exactly parallel to the plane of symmetry. The first semiconductor body and the first magnet are rigidly fixed to each other.
Public/Granted literature
- US20160363637A1 MAGNETIC FIELD MEASURING DEVICE Public/Granted day:2016-12-15
Information query
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