Invention Grant
US09551941B2 Illumination system for an EUV lithography device and facet mirror therefor
有权
用于EUV光刻设备及其面镜的照明系统
- Patent Title: Illumination system for an EUV lithography device and facet mirror therefor
- Patent Title (中): 用于EUV光刻设备及其面镜的照明系统
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Application No.: US14796164Application Date: 2015-07-10
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Publication No.: US09551941B2Publication Date: 2017-01-24
- Inventor: Johannes Ruoff , Ingo Saenger , Joerg Zimmermann , Daniel Kraehmer , Christoph Hennerkes , Frank Schlesener
- Applicant: Carl Zeiss SMT GmbH
- Applicant Address: DE Oberkochen
- Assignee: Carl Zeiss SMT GmbH
- Current Assignee: Carl Zeiss SMT GmbH
- Current Assignee Address: DE Oberkochen
- Agency: Fish & Richardson P.C.
- Priority: DE102013202948 20130222
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G02B27/09 ; G02B26/08

Abstract:
The invention relates to an illumination system for an EUV lithography device, comprising: a first facet mirror having facet elements that reflect EUV radiation, and a second facet mirror having facet elements for reflecting the EUV radiation reflected by the first facet mirror onto an illumination field. At least one of the facet elements of the first facet mirror or of the second facet mirror is designed as a diffractive optical element for diffracting the EUV radiation. In particular, at least one of the facet elements of the second facet mirror is designed as a diffractive optical element for illuminating only a part of the illumination field. The invention also relates to an EUV lithography device comprising such an illumination system, and to a facet mirror comprising at least one diffractive facet element.
Public/Granted literature
- US20160004164A1 ILLUMINATION SYSTEM FOR AN EUV LITHOGRAPHY DEVICE AND FACET MIRROR THEREFOR Public/Granted day:2016-01-07
Information query
IPC分类: