Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US15054920Application Date: 2016-02-26
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Publication No.: US09551943B2Publication Date: 2017-01-24
- Inventor: Akimitsu Ebihara
- Applicant: NIKON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: NIKON CORPORATION
- Current Assignee: NIKON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2003-174259 20030619
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42 ; G03F7/20 ; B82Y10/00

Abstract:
An exposure apparatus and method exposes a substrate via a projection optical system and a liquid supplied to an immersion area below the projection optical system. First and second movable members move below the projection optical system. The first movable member has a mount area that mounts a substrate located in a hole of an upper surface of the first movable member. The upper surface outside the hole can maintain at least a part of the immersion area outside the substrate mounted in the hole. A drive system drives the first and second movable members to move the first and second movable members below the projection optical system relative to the liquid immersion region to replace one member positioned below the projection optical system with the other member such that the liquid immersion area is maintained below the projection optical system.
Public/Granted literature
- US20160202617A1 EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD Public/Granted day:2016-07-14
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