Invention Grant
- Patent Title: Systems and methods for yaw estimation
- Patent Title (中): 偏航估计系统和方法
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Application No.: US14728795Application Date: 2015-06-02
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Publication No.: US09552513B2Publication Date: 2017-01-24
- Inventor: Athinarayanan Sankaranarayanan , Kamal Bijlani
- Applicant: Amrita Vishwa Vidyapeetham
- Applicant Address: IN Amritapuri, Kollam, Kerala
- Assignee: Amrita Vishwa Vidyapeetham
- Current Assignee: Amrita Vishwa Vidyapeetham
- Current Assignee Address: IN Amritapuri, Kollam, Kerala
- Agency: Convergance Intellectual Property Law P.C.
- Agent Jonathan Garfinkel
- Priority: IN2698/CHE/2014 20140602
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01B9/02
Abstract:
Systems and methods of automatic detection of a facial feature are disclosed. Moreover, methods and systems of yaw estimation of a human head based on a geometrical model are also disclosed.
Public/Granted literature
- US20150348257A1 SYSTEMS AND METHODS FOR YAW ESTIMATION Public/Granted day:2015-12-03
Information query
