Invention Grant
- Patent Title: Memory device with sampled resistance controlled write voltages
- Patent Title (中): 具有采样电阻控制写入电压的存储器件
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Application No.: US14872438Application Date: 2015-10-01
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Publication No.: US09552863B1Publication Date: 2017-01-24
- Inventor: Thomas Andre , Syed Alam , Chitra K. Subramanian , Dietmar Gogl
- Applicant: Everspin Technologies, Inc.
- Applicant Address: US AZ Chandler
- Assignee: Everspin Technologies, Inc.
- Current Assignee: Everspin Technologies, Inc.
- Current Assignee Address: US AZ Chandler
- Agency: Lee & Hayes, PLLC
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C11/16 ; G11C13/00 ; G11C11/14 ; G11C11/15

Abstract:
A memory device is configured to identify a set of bit cells to be changed from a first state to a second state. In some examples, the memory device may apply a first voltage to the set of bit cells to change a least a first portion of the set of bit cells to the second state. In some cases, the memory device may also identify a second portion of the bit cells that remained in the first state following the application of the first voltage. In these cases, the memory device may apply a second voltage having a greater magnitude, duration, or both to the second portion of the set of bit cells in order to set the second portion of bit cells to the second state.
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