Invention Grant
- Patent Title: Charge pump strength calibration and screening in circuit design
- Patent Title (中): 电路设计中的电荷泵强度校准和筛选
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Application No.: US15009010Application Date: 2016-01-28
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Publication No.: US09553506B1Publication Date: 2017-01-24
- Inventor: Jonathan Huynh , Sung-En Wang , Jongmin Park
- Applicant: SanDisk Technologies Inc.
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: G05F1/10
- IPC: G05F1/10 ; G05F3/02 ; H02M3/07 ; H03L7/089

Abstract:
Techniques and apparatuses for identifying weak charge pumps and for setting an optimal clock period for charge pumps to minimize variations in a current-voltage characteristic. A current sink which absorbs a specified current is connected to an output node of a charge pump. In one approach, a success or fail status is set for a charge pump by driving it with a specified clock period in a constantly pumping mode and determining if the output voltage reaches a specified output voltage. In another approach, a success or fail status is set for a charge pump by driving it with a specified clock period in a regulation mode and determining if the period in which the output voltage cycles is a specified multiple, e.g., 2×, of a period of the clock signal. In another approach, an optimal clock period is determined.
Information query
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