Invention Grant
- Patent Title: Delay-locked loop with false-lock detection and recovery circuit
- Patent Title (中): 具有假锁检测和恢复电路的延迟锁定环路
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Application No.: US14968918Application Date: 2015-12-15
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Publication No.: US09553594B1Publication Date: 2017-01-24
- Inventor: Atul Gupta , Risi Jaiswal
- Applicant: FREESCALE SEMICONDUCTOR, INC.
- Applicant Address: US TX Austin
- Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee: FREESCALE SEMICONDUCTOR, INC.
- Current Assignee Address: US TX Austin
- Agent Charles E. Bergere
- Main IPC: H03L7/06
- IPC: H03L7/06 ; H03L7/08 ; H03L7/081 ; H03L7/087 ; H03L7/089 ; H03L7/18

Abstract:
A DLL includes a phase detector, a counter, a delay circuit, and a false-lock detection and recovery circuit. The false-lock detection and recovery circuit checks whether the DLL is in a true-lock condition or not, based on an average of a phase difference between a clock signal and an intermediate clock signal. The intermediate clock signal is generated by the delay circuit based on a count value generated by the counter and a select signal generated by the false-lock detection and recovery circuit. The false-lock detection and recovery circuit generates and provides a control signal to the counter. Based on the control signal, the counter modifies the count on which a delay between the clock signal and an output signal of the DLL depends when the DLL is not in the true-lock condition.
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