Invention Grant
- Patent Title: Resistive crosspoint memory array sensing
- Patent Title (中): 电阻式交叉点存储器阵列感测
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Application No.: US15031106Application Date: 2013-10-29
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Publication No.: US09558820B2Publication Date: 2017-01-31
- Inventor: Frederick Perner , Yoocharn Jeon
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agent Fabian VanCott
- International Application: PCT/US2013/067268 WO 20131029
- International Announcement: WO2015/065337 WO 20150507
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
A method includes applying a voltage bump across a combined memory device comprising a volatile selector switch and a nonvolatile switch, in which the voltage bump changes a state of the volatile selector switch from a high resistance to a low resistance but does not change a state of the nonvolatile switch. A read voltage that is lower than the voltage bump across the combined memory device to read a state of the nonvolatile switch.
Public/Granted literature
- US20160267970A1 RESISTIVE CROSSPOINT MEMORY ARRAY SENSING Public/Granted day:2016-09-15
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