Invention Grant
- Patent Title: Wireless device test station calibration
- Patent Title (中): 无线设备测试站校准
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Application No.: US13660881Application Date: 2012-10-25
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Publication No.: US09559793B2Publication Date: 2017-01-31
- Inventor: Palaniappan Meiyappan
- Applicant: MICROSOFT TECHNOLOGY LICENSING, LLC
- Applicant Address: US WA Redmond
- Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
- Current Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
- Current Assignee Address: US WA Redmond
- Agent Gregg Wisdom; Judy Yee; Micky Minhas
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G06F19/00 ; H04B17/14 ; H04B17/00

Abstract:
Embodiments for calibrating a radiofrequency (RF) test station with a portable RF test station calibration device are disclosed. In one example, a portable RF test station calibration device comprises an RF power meter, a power sensor, and a computing device. The computing device may be configured to connect to the RF test instrument and to the RF power meter. The computing device may further comprise instructions executable by a logic subsystem to control the RF test instrument to transmit one or more RF signals having requested transmission values, receive measured transmission values from the RF power meter, determine a difference between the requested transmission values and the measured transmission values, and send a calibration value to the RF test instrument to be stored at the RF test instrument, the calibration value derived from the difference between the requested transmission values and the measured transmission values.
Public/Granted literature
- US20140122009A1 WIRELESS DEVICE TEST STATION CALIBRATION Public/Granted day:2014-05-01
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