Invention Grant
- Patent Title: Apparatus for inspecting curvature
- Patent Title (中): 用于检查曲率的装置
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Application No.: US14527056Application Date: 2014-10-29
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Publication No.: US09562763B2Publication Date: 2017-02-07
- Inventor: Kuk Won Ko
- Applicant: Sunmoon University Industry-University Cooperation
- Applicant Address: KR Asan-si
- Assignee: Sunmoon University Industry—University Cooperation
- Current Assignee: Sunmoon University Industry—University Cooperation
- Current Assignee Address: KR Asan-si
- Agency: NSIP Law
- Main IPC: G02B27/00
- IPC: G02B27/00 ; G01B11/24 ; G01N21/88 ; G01B11/255

Abstract:
An apparatus for inspecting curvature, including: a radiation unit radiating a plurality of rays of light having different focal lengths onto a surface of an target material; and an inspection unit inspecting the surface of the target material using the rays of light reflected from the target material. The apparatus can inspect the curvature or the bending of the surface of a target material at a high speed and with high accuracy.
Public/Granted literature
- US20160123896A1 APPARATUS FOR INSPECTING CURVATURE Public/Granted day:2016-05-05
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