Invention Grant
- Patent Title: Analysis device
- Patent Title (中): 分析装置
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Application No.: US14041811Application Date: 2013-09-30
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Publication No.: US09562859B2Publication Date: 2017-02-07
- Inventor: Kazuyoshi Horii , Junpei Shiraishi
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM CORPORATION
- Current Assignee: FUJIFILM CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2011-080908 20110331
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G06F1/20 ; G01N21/03 ; B01L7/00 ; G05D23/19 ; G01N35/00 ; B01L3/00

Abstract:
An analysis device for performing analysis about a substance by using an analysis chip having therein a reaction area that reacts with the substance is provided. The analysis device includes: a control section in contact with the analysis chip; a first sensor for measuring an ambient temperature of the analysis chip; a second sensor for measuring the temperature at a contact area of the control section in contact with the analysis chip, and a control circuit for performing feedback control of the control section by finding a temperature of the contact area for achieving a desired temperature of the reaction area based on the ambient temperature measured by the first sensor and a temperature gradient between a position at which the ambient temperature is measured and the reaction area, setting the found temperature as a target value and setting the temperature detected by the second sensor as an output value.
Public/Granted literature
- US20140030151A1 ANALYSIS DEVICE Public/Granted day:2014-01-30
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