Invention Grant
- Patent Title: Automatic analysis device and automatic analysis program
- Patent Title (中): 自动分析装置和自动分析程序
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Application No.: US14117717Application Date: 2012-04-17
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Publication No.: US09562917B2Publication Date: 2017-02-07
- Inventor: Chihiro Manri , Satoshi Mitsuyama , Tomonori Mimura , Kumiko Kamihara
- Applicant: Chihiro Manri , Satoshi Mitsuyama , Tomonori Mimura , Kumiko Kamihara
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2011-109558 20110516
- International Application: PCT/JP2012/060348 WO 20120417
- International Announcement: WO2012/157386 WO 20121122
- Main IPC: G01N31/00
- IPC: G01N31/00 ; G01N35/00 ; G01N35/04

Abstract:
Accuracy control of an automatic analysis device that mixes a sample and a reagent to measure temporal change of a mixed solution is realized. A plurality of measurement point data is acquired from a reaction process of the sample and the reagent. Parameters and test values of approximate equations for approximating the plurality of measurement point data are accumulated in a storage unit. A distribution map of reference data corresponding to the parameters or the test values is created based on predetermined numbers of the parameters or the test values accumulated in the storage unit. Next, a plurality of screens for individually superimposing, on the distribution map, curved lines corresponding to a plurality of regression function candidates obtained by applying a plurality of regression functions are arranged and presented on a display screen, so as to approximate the data to the distribution map of the reference data.
Public/Granted literature
- US20140136123A1 AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS PROGRAM Public/Granted day:2014-05-15
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