Invention Grant
- Patent Title: Force detection for microscopy based on direct tip trajectory observation
- Patent Title (中): 基于直接尖端轨迹观察的显微镜力检测
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Application No.: US14872332Application Date: 2015-10-01
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Publication No.: US09562927B2Publication Date: 2017-02-07
- Inventor: Gavin McLean King , Krishna Prasad Sigdel
- Applicant: The Curators of the University of Missouri
- Applicant Address: US MO Columbia
- Assignee: The Curators of the University of Missouri
- Current Assignee: The Curators of the University of Missouri
- Current Assignee Address: US MO Columbia
- Agency: Thompson Coburn LLP
- Main IPC: G01Q20/02
- IPC: G01Q20/02 ; G01Q20/00 ; G01Q60/24 ; G01Q30/04 ; G01Q60/34
Abstract:
With example embodiments described herein, a probe tip of a scanning probe microscope (such as an atomic force microscope (AFM)) is directly detected as it moves in a tapping mode to determine the tip positions over time, and a force for the tip is computed from these determined tip positions.
Public/Granted literature
- US20160124014A1 Force Detection for Microscopy Based on Direct Tip Trajectory Observation Public/Granted day:2016-05-05
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