Invention Grant
- Patent Title: Technique for determining performance characteristics of electronic devices and systems
- Patent Title (中): 确定电子设备和系统性能特点的技术
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Application No.: US13920368Application Date: 2013-06-18
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Publication No.: US09562934B2Publication Date: 2017-02-07
- Inventor: Haw-Jyh Liaw , Xingchao Yuan , Mark A. Horowitz
- Applicant: Rambus Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Rambus Inc.
- Current Assignee: Rambus Inc.
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G01R23/20
- IPC: G01R23/20 ; G01R31/317 ; G11C29/02 ; G11C29/50 ; G11C29/56 ; H04B17/309
Abstract:
A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
Public/Granted literature
- US20140070819A1 Technique for Determining Performance Characteristics Of Electronic Devices And Systems Public/Granted day:2014-03-13
Information query
