Invention Grant
- Patent Title: Testing apparatus for providing per pin level setting
- Patent Title (中): 用于提供每个引脚电平设置的测试设备
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Application No.: US13897239Application Date: 2013-05-17
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Publication No.: US09562947B2Publication Date: 2017-02-07
- Inventor: Hsin-Hao Chen , Po-Shen Kuo
- Applicant: Test Research, Inc.
- Applicant Address: TW Taipei
- Assignee: Test Research, Inc.
- Current Assignee: Test Research, Inc.
- Current Assignee Address: TW Taipei
- Agency: CKC & Partners Co., Ltd.
- Priority: TW102110515A 20130325
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/319 ; G01R31/28 ; G01R1/073 ; G01R1/04 ; G01R31/327
Abstract:
A testing apparatus for providing per pin level setting is disclosed, and the testing apparatus includes a control unit and a filter circuit, where the control unit is electrically connected to the filter circuit. The control unit includes a field programmable gate array (FPGA) for providing a PWM signal. The filter circuit receives the PWM signal and outputs at least one DC voltage.
Public/Granted literature
- US20140285228A1 TESTING APPARATUS FOR PROVIDING PER PIN LEVEL SETTING Public/Granted day:2014-09-25
Information query
