Invention Grant
- Patent Title: Walk through metal detection system
- Patent Title (中): 走过金属检测系统
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Application No.: US13175785Application Date: 2011-07-01
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Publication No.: US09562986B2Publication Date: 2017-02-07
- Inventor: Anthony J. Peyton , David W. Armitage , Liam A. Marsh , Christos Ktistis , William Robert Breckon Lionheart , Ari Järvi
- Applicant: Anthony J. Peyton , David W. Armitage , Liam A. Marsh , Christos Ktistis , William Robert Breckon Lionheart , Ari Järvi
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Agent Hazim Ansari; Sona Dalal
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01V3/12 ; G01V3/10

Abstract:
The present application is a detection system for locating and characterizing an object placed in a detection area in a three dimensional space. The detection system includes a plurality of magnetic field generators and magnetic field detectors arranged on opposite sides of the detection area and a control system for enabling generation of a magnetic field in the detection area by the magnetic field generators and for measuring of the magnetic field modified by the object at each of the magnetic field detectors. The detection system also includes a processor for processing the measured magnetic field to obtain a data set characterizing the object and a location of the object. The processor applies a reconstruction process on a predefined number of measurements of the modified magnetic field.
Public/Granted literature
- US20130006552A1 Walk Through Metal Detection System Public/Granted day:2013-01-03
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