Invention Grant
- Patent Title: On chip ZQ calibration resistor trimming
- Patent Title (中): 片上ZQ校准电阻修剪
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Application No.: US14966891Application Date: 2015-12-11
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Publication No.: US09563213B2Publication Date: 2017-02-07
- Inventor: Sravanti Addepalli , Sridhar Yadala
- Applicant: SanDisk Technologies Inc.
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: H03K19/003
- IPC: H03K19/003 ; H03K17/16 ; G05F1/46 ; G11C16/06 ; H03K19/00

Abstract:
Techniques for trimming an on chip ZQ calibration resistor are disclosed. The on chip ZQ calibration resistor alleviates the need for an external ZQ calibration resistor. The on chip ZQ calibration resistor allows for a faster ZQ calibration. The trimming of on chip ZQ calibration resistor may be used to account for process variation. A correction mechanism may be used to account for temperature variation. Some of the circuitry that is used for ZQ calibration is also used for trimming the on-chip calibration resistor. This circuitry may include operational amplifiers, current mirrors, transistors, etc. The dual use of the circuitry can eliminate offset errors in an operational amplifier. The dual use can eliminate current mirror mismatch. Therefore, the trimming accuracy may be improved. The dual use also reduces the amount of circuitry that is needed for trimming the on chip ZQ calibration resistor. Thus, transistor count and chip size is reduced.
Public/Granted literature
- US20160182044A1 On Chip ZQ Calibration Resistor Trimming Public/Granted day:2016-06-23
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