An extraction method comprising: acquiring configuration information indicating a configuration of a processing device for each generation that represents a respective time period between configuration modifications, and extracting first information indicating configuration modifications between generations based on a plurality of generations of the acquired configuration information; acquiring performance information indicating various types of performance of the processing device at respective times, and extracting, as second information associated with one of the generations, a time when an abnormality was detected in change to a time series of the acquired performance information; acquiring event information indicating an event occurring in the processing device at respective times, and extracting, as third information associated with one of the generations, a time of event information creation when an abnormality was detected; and extracting the first information, the second information, and the third information that have a relationship to each other.