Invention Grant
- Patent Title: Automated defect positioning based on historical data
- Patent Title (中): 基于历史数据的自动缺陷定位
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Application No.: US14507855Application Date: 2014-10-07
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Publication No.: US09563540B2Publication Date: 2017-02-07
- Inventor: Dhanyamraju S U M Prasad , Simy Chacko , Satya Sai Prakash K , Sekhar Ramaraju , Suresh Naidu P
- Applicant: Dhanyamraju S U M Prasad , Simy Chacko , Satya Sai Prakash K , Sekhar Ramaraju , Suresh Naidu P
- Applicant Address: IN Chennai
- Assignee: HCL TECHNOLOGIES LTD
- Current Assignee: HCL TECHNOLOGIES LTD
- Current Assignee Address: IN Chennai
- Agency: VKM Law Group
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
Disclosed herein are a method and a system for software defect positioning. The system collects at least one type of information with respect to the defect and analyzes the collected input to select a suitable mode of defect positioning procedure. The defect positioning procedures used by the system identify defect location/position based on history data. After identifying the location of the defect, the system communicates the identified defect location/position to a user using a suitable output interface.
Public/Granted literature
- US20150370689A1 AUTOMATED DEFECT POSITIONING BASED ON HISTORICAL DATA Public/Granted day:2015-12-24
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