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US09564508B2 Device isolation with improved thermal conductivity 有权
具有改善导热性的器件隔离

Device isolation with improved thermal conductivity
Abstract:
A method of making a semiconductor structure includes forming a trench through a shallow trench isolation (STI) structure and into a substrate, and forming a liner including an electrical insulator material on sidewalls of the trench. The method also includes forming a core including a high thermal conductivity material in the trench and on the liner, and forming a cap in the trench and on the core.
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