Invention Grant
- Patent Title: Strain mapping in TEM using precession electron diffraction
- Patent Title (中): 使用进动电子衍射的TEM中的应变映射
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Application No.: US14890560Application Date: 2014-05-23
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Publication No.: US09568442B2Publication Date: 2017-02-14
- Inventor: Mitra Lenore Taheri , Asher Calvin Leff
- Applicant: Mitra Lenore Taheri , Asher Calvin Leff
- Applicant Address: US PA Philadelphia
- Assignee: Drexel University
- Current Assignee: Drexel University
- Current Assignee Address: US PA Philadelphia
- Agency: Mendelsohn Dunleavy, P.C.
- International Application: PCT/US2014/039293 WO 20140523
- International Announcement: WO2014/190239 WO 20141127
- Main IPC: G01N23/20
- IPC: G01N23/20 ; G01N23/02 ; G01L1/25 ; G01N23/04 ; H01J37/26
Abstract:
A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
Public/Granted literature
- US20160139063A1 Strain Mapping in TEM Using Precession Electron Diffraction Public/Granted day:2016-05-19
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