Invention Grant
- Patent Title: Managing redundancy repair using boundary scans
- Patent Title (中): 使用边界扫描管理冗余修复
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Application No.: US14823338Application Date: 2015-08-11
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Publication No.: US09568549B2Publication Date: 2017-02-14
- Inventor: Steven M. Douskey , Ryan A. Fitch , Michael J. Hamilton , Amanda R. Kaufer
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Mark G. Edwards
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/3177 ; G01R31/3185
Abstract:
An IO structure, method, and apparatus are disclosed for using an IEEE™ 1149.1 boundary scan latch to reroute a functional path. The method for a chip using IEEE™ 1149.1 boundary scan latches may include using the IEEE™ 1149.1 boundary scan latches for testing IO on the chip in a test mode. The method may also include using information stored in the IEEE™ 1149.1 boundary scan latches to route signals around a failing path in a functional mode.
Public/Granted literature
- US20150346279A1 MANAGING REDUNDANCY REPAIR USING BOUNDARY SCANS Public/Granted day:2015-12-03
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