Invention Grant
- Patent Title: Distribution analysis device
- Patent Title (中): 分布分析装置
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Application No.: US14115650Application Date: 2012-05-01
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Publication No.: US09568567B2Publication Date: 2017-02-14
- Inventor: Kenjiro Kimura
- Applicant: Kenjiro Kimura
- Applicant Address: JP Hyogo
- Assignee: NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Current Assignee: NATIONAL UNIVERSITY CORPORATION KOBE UNIVERSITY
- Current Assignee Address: JP Hyogo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2011-104143 20110509
- International Application: PCT/JP2012/002951 WO 20120501
- International Announcement: WO2012/153496 WO 20121115
- Main IPC: G01R33/10
- IPC: G01R33/10 ; G01R33/12 ; G06F17/13 ; G01R33/00

Abstract:
A distribution analysis device analyzes a distribution of a field having a property satisfying the Laplace equation, and includes: an obtainment unit that obtains measurement data indicating the distribution of the field measured through a sensor sensing area, the sensor sensing area being an area that moves in a measurement area where the distribution of the field is measured and being an area in which the field is sensed as an aggregate; and a calculation unit that calculates analysis data indicating the distribution of the field with a higher resolution than the measurement data, using an arithmetic expression that is obtained by deriving a solution of the Laplace equation using a boundary condition that an integral of the solution of the Laplace equation in a finite interval corresponding to a size of the sensor sensing area matches the measurement data.
Public/Granted literature
- US20140081584A1 DISTRIBUTION ANALYSIS DEVICE Public/Granted day:2014-03-20
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