Invention Grant
- Patent Title: Radiation imaging apparatus, method for manufacturing the same, and radiation inspection apparatus
- Patent Title (中): 辐射成像装置及其制造方法以及放射线检查装置
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Application No.: US14962421Application Date: 2015-12-08
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Publication No.: US09568617B2Publication Date: 2017-02-14
- Inventor: Tomoaki Ichimura
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2015-003610 20150109
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/202 ; G01T7/00

Abstract:
A radiation imaging apparatus, comprising a sensor panel on which a plurality of sensors are arrayed, a scintillator that is arranged over a base member and is made of an alkali halide, and a protective film configured to suppress deliquescence of the scintillator, wherein the protective film includes a first portion that covers a side face of the scintillator and an end of the scintillator on a side opposite to the base member, and a second portion that is smaller in a content of fluorine than the first portion and covers at least part of a surface of the first portion.
Public/Granted literature
- US20160202362A1 RADIATION IMAGING APPARATUS, METHOD FOR MANUFACTURING THE SAME, AND RADIATION INSPECTION APPARATUS Public/Granted day:2016-07-14
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