Invention Grant
- Patent Title: Semiconductor device and method of operating the same according to degree of deterioration
- Patent Title (中): 根据劣化程度的半导体装置及其操作方法
-
Application No.: US14696003Application Date: 2015-04-24
-
Publication No.: US09569142B2Publication Date: 2017-02-14
- Inventor: Ju Hyeon Han
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2014-0164334 20141124
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G06F3/06 ; G11C16/00 ; G11C16/10
Abstract:
A semiconductor device and a method of operating the same are provided. The method includes determining the degree of deterioration of a selected memory block, performing a program operation of the selected memory block in a first program operating condition when it is determined that the selected memory block is not deteriorated and performing the program operation of the selected memory block in a second program operating condition when it is determined that the selected memory is deteriorated, and updating the program operating time of the selected memory block.
Public/Granted literature
- US20160147624A1 SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME Public/Granted day:2016-05-26
Information query
