Invention Grant
- Patent Title: Pattern extracting apparatus and method
- Patent Title (中): 模式提取装置及方法
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Application No.: US14124100Application Date: 2012-05-25
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Publication No.: US09569835B2Publication Date: 2017-02-14
- Inventor: Shigeaki Sakurai , Rumi Hayakawa , Seiji Egawa
- Applicant: Shigeaki Sakurai , Rumi Hayakawa , Seiji Egawa
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA SOLUTIONS CORPORATION
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA SOLUTIONS CORPORATION
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-128596 20110608
- International Application: PCT/JP2012/003433 WO 20120525
- International Announcement: WO2012/169137 WO 20121213
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06Q30/02 ; G06K9/62

Abstract:
A pattern extracting apparatus includes a first storing section storing plural target information pieces, a candidate pattern producing section producing candidate patterns each including two or more items different from each other based on each of the items included in the plural target information pieces, a candidate evaluation value calculating section calculating an extraction evaluation value of the candidate pattern based on a frequency of appearance at which the produced candidate pattern appears in the plural target information pieces, a pattern extracting section determining and extracting any of the candidate patterns having the calculated extraction evaluation value satisfying a predetermined threshold value, and a second storing section storing an association degree between the items. The candidate evaluation value calculating section calculates the extraction evaluation value based on a weight based on an identified association degree between the items included in the candidate pattern and the frequency of appearance.
Public/Granted literature
- US20140112549A1 PATTERN EXTRACTING APPARATUS AND METHOD Public/Granted day:2014-04-24
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