Invention Grant
- Patent Title: Reusable semiconductor substrates
- Patent Title (中): 可重复使用的半导体衬底
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Application No.: US14795684Application Date: 2015-07-09
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Publication No.: US09570351B2Publication Date: 2017-02-14
- Inventor: Di Liang
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Tong, Rea, Bentley & Kim, LLC
- Main IPC: H01L29/32
- IPC: H01L29/32 ; H01L21/78 ; H01L21/02 ; H01L21/3105 ; H01L23/00

Abstract:
In example implementations, a plurality of material layers and a plurality of etch stop layers are grown on a first substrate. Ions are implanted through at least one material layer of the plurality of material layers into an etch stop layer of the plurality of etch stop layers to create defects in the etch stop layer. A first material layer of the substrate is bonded to a second substrate. The etch stop layer is split to remove the first substrate from the second substrate. The first substrate is reused to bond another material layer of the plurality of material layers to a third substrate.
Public/Granted literature
- US20170011964A1 REUSABLE SEMICONDUCTOR SUBSTRATES Public/Granted day:2017-01-12
Information query
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