Invention Grant
US09571102B2 Semiconductor device having impedance calibration function to data output buffer and semiconductor module having the same
有权
具有对数据输出缓冲器和具有该阻抗校准功能的半导体模块的半导体器件
- Patent Title: Semiconductor device having impedance calibration function to data output buffer and semiconductor module having the same
- Patent Title (中): 具有对数据输出缓冲器和具有该阻抗校准功能的半导体模块的半导体器件
-
Application No.: US14938351Application Date: 2015-11-11
-
Publication No.: US09571102B2Publication Date: 2017-02-14
- Inventor: Kentaro Hara
- Applicant: PS4 Luxco S.a.r.l.
- Applicant Address: LU Luxembourg
- Assignee: LONGITUDE SEMICONDUCTOR S.A.R.L.
- Current Assignee: LONGITUDE SEMICONDUCTOR S.A.R.L.
- Current Assignee Address: LU Luxembourg
- Agency: Kunzler Law Group, PC
- Priority: JP2011-222935 20111007
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/0185 ; H03K19/003 ; H03K19/0175 ; G11C29/02 ; G11C29/12 ; G11C29/48 ; G11C11/4093 ; H03K19/00 ; H03K19/094 ; G11C11/40 ; G11C11/4076
Abstract:
Disclosed herein is a semiconductor device that includes a first transistor unit coupled to the data terminal, and a plurality of second transistor units coupled to the calibration terminal. The first transistor unit includes a plurality of first transistors having a first conductivity type connected in parallel to each other so that an impedance of the first transistor unit is adjustable. Each of the second transistor units includes a plurality of second transistors having the first conductivity type connected in parallel to each other so that an impedance of each of the second transistor units is adjustable. The semiconductor device further includes an impedance control circuit that reflects the impedance of each of the second transistor units to the first transistor unit.
Public/Granted literature
Information query
