Invention Grant
- Patent Title: Wireless enclosure for testing electronic devices
- Patent Title (中): 用于测试电子设备的无线机箱
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Application No.: US14143142Application Date: 2013-12-30
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Publication No.: US09571211B2Publication Date: 2017-02-14
- Inventor: Jimmie Paul Partee
- Applicant: ATC Logistics & Electronics, Inc.
- Applicant Address: US TX Fort Worth
- Assignee: ATC Logistics & Electronics, Inc.
- Current Assignee: ATC Logistics & Electronics, Inc.
- Current Assignee Address: US TX Fort Worth
- Agency: McGuireWoods LLP
- Main IPC: H04B17/00
- IPC: H04B17/00 ; H04L12/26 ; H04H20/12
Abstract:
A system, method, and enclosure for testing wireless devices. The enclosure includes a number of walls enclosing a testing space. The enclosure also includes a sliding cover secured between the two of the number of walls. The enclosure also includes one or more radio frequency layers disposed on the number of walls and the sliding cover.
Public/Granted literature
- US20140187173A1 WIRELESS ENCLOSURE FOR TESTING ELECTRONIC DEVICES Public/Granted day:2014-07-03
Information query
