Invention Grant
- Patent Title: Calibration of multiple aperture ultrasound probes
- Patent Title (中): 多孔径超声探头的校准
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Application No.: US13964701Application Date: 2013-08-12
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Publication No.: US09572549B2Publication Date: 2017-02-21
- Inventor: Artem Belevich , Josef R. Call , Bruce R. Ritzi , Nathan W. Osborn
- Applicant: Maui Imaging, Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: MAUI IMAGING, INC.
- Current Assignee: MAUI IMAGING, INC.
- Current Assignee Address: US CA Sunnyvale
- Agency: Shay Glenn LLP
- Main IPC: G01S15/00
- IPC: G01S15/00 ; A61B8/00 ; A61B6/00 ; A61B8/12

Abstract:
The quality of ping-based ultrasound imaging is dependent on the accuracy of information describing the precise acoustic position of transmitting and receiving transducer elements. Improving the quality of transducer element position data can substantially improve the quality of ping-based ultrasound images, particularly those obtained using a multiple aperture ultrasound imaging probe, i.e., a probe with a total aperture greater than any anticipated maximum coherent aperture width. Various systems and methods for calibrating element position data for a probe are described.
Public/Granted literature
- US20140043933A1 Calibration of Multiple Aperture Ultrasound Probes Public/Granted day:2014-02-13
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