Invention Grant
- Patent Title: Transfer unit of test handler and method of operating the same
- Patent Title (中): 测试处理程序的传送单元及其操作方法
-
Application No.: US13894608Application Date: 2013-05-15
-
Publication No.: US09573235B2Publication Date: 2017-02-21
- Inventor: Jong-An Lee , Bum-Sic Kim , Young-Gil Lee , Chea-Geun Lim
- Applicant: Samsung Electronics Co., Ltd
- Applicant Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do
- Agency: Muir Patent Law, PLLC
- Priority: KR10-2012-0083256 20120730
- Main IPC: B23Q15/22
- IPC: B23Q15/22 ; B25J17/02 ; G01R31/28

Abstract:
A transfer unit of a test handler includes a base frame, a floating assembly, and an arm part. The base frame includes an inserted portion having a penetration hole. The inserted portion including an upper inserted portion disposed near an upper surface of the inserted portion, a lower portion disposed near a lower portion of the inserted portion and a middle inserted portion disposed between the upper inserted portion and the lower inserted portion. The floating assembly is inserted in the penetration hole of the base frame. The floating assembly includes a floating part, an elastic element, and a coupling element. The floating assembly moves back and forth, to left and right sides, and up and down, or flows within a predetermined angle range in the penetration hole.
Public/Granted literature
- US20140030047A1 TRANSFER UNIT OF TEST HANDLER AND METHOD OF OPERATING THE SAME Public/Granted day:2014-01-30
Information query