Invention Grant
- Patent Title: Terahertz-wave detection element, manufacturing method therefor, and observation apparatus
- Patent Title (中): 太赫兹波检测元件及其制造方法和观察装置
-
Application No.: US14665124Application Date: 2015-03-23
-
Publication No.: US09574933B2Publication Date: 2017-02-21
- Inventor: Jungo Kondo , Yuichi Iwata , Tetsuya Ejiri
- Applicant: NGK INSULATORS, LTD.
- Applicant Address: JP Aichi
- Assignee: NGK INSULATORS, LTD.
- Current Assignee: NGK INSULATORS, LTD.
- Current Assignee Address: JP Aichi
- Agency: Cermak Nakajima & McGowan LLP
- Agent Tomoko Nakajima
- Priority: JP2012-209412 20120924
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01N21/3581 ; G01J3/02 ; G01N21/3586 ; G01J3/42 ; G02F1/03

Abstract:
Provided a terahertz-wave detection element with high spatial resolution and suppressing a crack occurrence. A method of manufacturing the detection element capable of detecting a spatial intensity distribution of a terahertz wave includes: a step of forming an oxide layer on one main surface of a first substrate consisting of an electro-optic crystal; a step of joining the one main surface of the first substrate and a second substrate by an adhesive consisting; a step of thinning the first substrate of a joined body, to a thickness of 1-30 μm by polishing the first substrate; and a step of obtaining a large number of terahertz-wave detection elements by cutting the joined body. The oxide layer is formed such that the first substrate becomes convex to a side of the one main surface by causing a tensile stress to act on it.
Public/Granted literature
- US20150192458A1 Terahertz-Wave Detection Element, Manufacturing Method Therefor, and Observation Apparatus Public/Granted day:2015-07-09
Information query